Metallurgical Analysis
Our spectrometers, sub-systems and complete solutions are ideal for custom and OEM metallurgical applications. UV-Vis and NIR spectrometers can be integrated into setups for emission analysis, reflection measurements and more. Our high-resolution HR series spectrometers are especially powerful as part of a modular laser induced breakdown spectroscopy (LIBS) system. LIBS is an ideal technique for elemental analysis of metals and other materials.
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Example Setup: UV-Vis Reflection
Overview
Spectral reflectance measurements can be used to compare objects or to reveal information about the material from which a sample is made, since light that is not reflected from a sample is absorbed due to its chemical composition, or is scattered or transmitted.
Very smooth surfaces like some metals and alloys have high specular reflection, which means all the incident light is reflected in the same direction (angle of reflection = angle of incidence). Rough or matte surfaces have diffuse reflection, which means the incident light gets scattered in all directions. Most surfaces are in-between, with a combination of specular and diffuse reflectance.
Spectrometer
Our USB2000+, USB4000 and HR2000+ series spectrometers are good choices for reflection. In this example we’ve selected a USB4000-UV-VIS spectrometer, which is preconfigured for the range from 200-850 nm and includes a 25 µm entrance slit and order sorting filter.
Sampling Optics
A reflection probe is great for making quick measurements and can measure either specular or diffuse reflectance. The downside is that it illuminates and detects from the same direction, so it sees only part of the reflected light. Measurements made with a reflection probe are relative measurements.
The illustration here shows a 400 µm reflection probe (QR400-7-UV-VIS) and the RPH-1 probe holder. The holder positions the probe at either 45° for diffuse reflection or 90° for specular reflection. For curved surfaces, we recommend substituting one of our CSH holders for the RPH-1.
The DH-2000 combination deuterium tungsten halogen light source is used for illumination. In this setup, one leg from the reflection probe connects to the light source and the other leg (the read leg) connects to the spectrometer.
To complete the setup, we added a STAN-SSH high reflectivity specular reflectance standard as our reference and OceanView spectroscopy software to process the results.
| USB4000-UV-VIS | Preconfigured USB4000 CCD-array spectrometer provides coverage from 200-850 nm and includes a 25 µm slit and order sorting filter |
| DH-2000 | Combination deuterium tungsten halogen light source has powerful output from ~215-2000 nm |
| QR400-7-UV-VIS | Premium-grade reflection probe (6-around-1 fiber design), optimized for UV-Vis response, 2 m length |
| RPH-1 | Fixture for holding 1/4″ (6.35 mm) diameter reflection probes |
| STAN-SSH | Specular reflectance standard provides ~85-90% reflectance from 250-800 nm and ~85-98% reflectance from 800-2500 nm range |
| OceanView | Spectroscopy software combines powerful data processing capabilities with a clear graphical user interface |
Spectral features for zinc are particularly distinct in the visible wavelength region.
A modular spectrometer is easily configured to measure reflectance of metallic surfaces.
Laser induced breakdown spectroscopy is a useful tool for element analysis. Our high-resolution spectrometers work well in modular LIBS setups.
Fluorescence effects from aluminum housings (cans) used in recessed lighting vary by sample.
Copper(II) chloride spectra were captured using a USB2000+UV-VIS spectrometer with deuterium source, cuvette holder and solarization-resistant optical fibers.
